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  News and Events  
        FEI Company and Tianjin University of Technology (TUT) have agreed to set up TUTFEI Joint Lab in Center for Electron Microscopy (CEM), TUT. FEI will provide comprehensive service support to make su...
        These days, the aberration-corrected STEM with the newest FEI model of Titan Cubed Themis G2 300 and other 5 EMs of CEM of TUT have been installed and are being adjusted. The following pictures fig...
        When the composition of a material contains different elements, compositional tomography is required for revealing the 3D distribution of the different elements. The following figure is a 3D result...
  Equipment
 
TEM with a Probe Corrector
TEM with a ...
High-Resolution TEM with FEG
High-Resolu...
TEM with a LaB6 Gun
TEM with a ...
FIB-SEM System
FIB-SEM Sys...
Ultrahigh-Resolution SEM with FEG
Ultrahigh-R...
Environmental SEM with FEG
Environment...
Precision Ion Polishing System
Precision I...
 
  Contact Us

Center for Electron Microscopy, Tianjin University of Technology

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Email: 15032894174@163.com

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Fax: 0086-22-60216532

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