Home | About CEM | Members | Equipment | Publications | News | Equipment Booking | Vacancies 
 
Content  
 
Ultrahigh-Resolution SEM with FEG
2016-03-11 19:20  

Equipment Name

Ultrahigh-Resolution SEM with FEG

Model

Verios 460L

Manufacturer

FEI

Manufacture Year

2015

Engineer in Charge

Lei Wang

Tel: 022-60216409

E-Mail: wl00909004@163.com

Location

Room 108A, Bulding 12

Configuration & Capability

1. SE Resolution: ≤0.6 nm @ 2 kV;  ≤0.7 nm @ 1 kV

2. Landing Voltage of Electron Beam: 20 V ~ 30 kV

3. Probe Current:  0.8 pA ~ 100 nA (15 kV); 0.8 pA ~ 100 nA (2 kV); 0.8 pA ~ 100 nA (1 kV)

4. STEM detectors

5. Transfer Holder to Protect Samples from Oxidation by Air

 

地址:天津市西青区宾水西道391号  邮编:300384

电话(传真):0086-22-60216416  邮箱:yxny@tjut.edu.cn