Equipment Name

High-Resolution TEM with FEG

Model

Talos F200X

Manufacturer

FEI

Manufacture Year

2015

Engineers in Charge

Jing Shi, Ruirui Liu

Tel: 022-60216409

E-Mail: shijing0902@qq.com

Location

Rooms 109A and 109B, Building 12

Configuration & Capability

1. Point Resolution of TEM: ≤0.25 nm (200 kV)

2. Point Resolution of HAADF: ≤0.16 nm (200 kV)

3. EDS System of Super X

4. Polepiece Gap: ≥5mm

5. Spatial Resolution of STEM Tomography: ≤1 nm (200 kV)

6. Spatial Resolution of EDS Tomography: ≤2 nm (200 kV)

7. DPC Detector